SoC / Logic
Chip-Card / Smart Card
Image / CMOS Sensors
High Pin Count
Minute Current Measurement
POAA / POP
|Parametric Test Probe Card|
STAr is the leading supplier of high quality low-leakage current, ultra-high voltage, wide temperature range and multi-site/die probe cards for electrical tests, wafer-acceptance tests and reliability qualification.
Repair Shops equipped with original MPI compatible tools. Cantilever and Vertical Probe Card repairs.
Same quality criteria as manufacturer.
10++ years of experience in Probe Card repair.
Capabilities of Gold-Plating, Component Exchange and detailed measurements available.
Repair Center Munich
Mainly for Cantilever style Probe Cards
Repair Center Dresden