Probe Cards

STAr Technologies Inc.

Sedicon

Winway Technology

Applications

  • SoC / Logic

  • LCD-Driver

  • Parametric

  • Memory

  • Chip-Card / Smart Card

  • RF

  • Image / CMOS Sensors

  • Mixed Signal

  • WLCSP

Requirements

  • High Pin Count

  • Fine Pitch

  • High Frequency

  • High Current

  • High Temperature

  • Minute Current Measurement

  • Kelvin

  • POAA / POP

  • Bumps

  • Transport boxes

 

Technologies

  • Cantilever

  • Advanced Cantilever

  • Vertical

  • Spring Pin

 

Technologies

Vertical Probe Card

Cantilever Probe Card

Spring Pin Probe Card

Applications

Probe Card for Chipards

Parametric

Probe Card

LCD Diver

Probe Cards

High Speed Vertical

Probe Card

Probe Card for

Chip on Foil

Chip Card

Vertical Probe Card

SOC

Probe Card

BGA Micro Processor

Vertical Probe Card

Optical Sensor

Probe Card

Logic

Vertical Probe Card

Parametric Test Probe Card

STAr is the leading supplier of high quality low-leakage current, ultra-high voltage, wide temperature range and multi-site/die probe cards for electrical tests, wafer-acceptance tests and reliability qualification.

 

  • Parametric Test Probe Card
  • Reliability Test Probe Card
  • Multi-Site/Die Test Probe Card
  • Specialized Probe Card

 

Vertical Probe Card  
STAr has developed a proprietary patented vertical probe card technology featuring high carrying current, superior lifetime and scalability to address the industry's most demanding pitch requirements.
  • Parametric Vertical Probe Card
  • SOC IC Vertical Probe Card Memory
  • IC Vertical Probe Card
  • Mixed-Signal Vertical Probe Card
 
 

Functional Probe Card  

STAr's functional cantilever probe cards represent the finest epoxy technology on the market that features extreme fine pitch (<20 um) for LCD driver ICs and high density probe counts (>3000) for multi-DUT logic and memory ICs.

  • SOC IC Test Probe Card
  • LCD Driver IC Test Probe Card
  • Memory IC Test Probe Card
  • CMOS Sensor Test Probe Card
 
 

 

Repair and Maintenance Shops

Repair Shops equipped with original MPI compatible tools. Cantilever and Vertical Probe Card repairs.

Same quality criteria as manufacturer.

10++ years of experience in Probe Card repair.

Capabilities of Gold-Plating, Component Exchange and detailed measurements available.

 

Repair Center Munich

 

Mainly for Cantilever style Probe Cards

 

Available Tooling

  • Sanding Machine
  • Coordinate Checker
  • ARS01 Needle Adjustment Tool
  • High Power Microscope
  • Various Test Boards

 

Repair Center Dresden

 

Availalbe tooling

  • High Power Microscope
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