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Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices

 

High-Performance Multilayer Printed Circuit Boards for ATE Applications, Blank Boards for Probe Cards - Handler Interface Boards - Test Boards - Burn in Boards - Engineering and Demo Boards

 

Test Sockets for IC Component Test - High-Performance Production Test Sockets and Contactors

 

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Sorter for for LED, Discrete, MEMS, Semiconductors by
     
Semi-Automatic Fully-Automatic Semi-Automatic
   

 
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Please contact aps for more information! 

 

Phone: 

0049 - (0)89-841 027-15

Fax:

0049 - (0)89-841 027-11

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wafertest@aps-munich.com
   
     
     
     
     

 
   

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