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Test Sockets for IC Component Test - High-Performance Production Test Sockets and Contactors  

Welcome to the aps Quality Test Socket & Contactor section!

 

Introduction

 

Spring Probe Sockets

 

Rigid Pin Sockets

 

Conductive Rubber Sockets

 

Coaxial Socket

 

Application Examples

 

Service & Support

 

RFQ Form

 

Contact

Email

Phone

 

 

Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices

High-Performance Multilayer Printed Circuit Boards for ATE Applications, Blank Boards for Probe Cards - Handler Interface Boards - Test Boards - Burn in Boards - Engineering and Demo Boards

aps Sales & Service GmbH - The European representative of the market leaders in Wafer Probing and IC Device Test

 

 

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To Win Way Homepage

 
  • We can offer you a wide range of High Quality ~ and High Performance Contactor Solutions for all nearly all applications in the Semiconductor and Electronics Industry.

 

  • We are focused on precision machined test sockets, contactor and test fixture solutions

 

  • We take care for excellent performance, high reliability and long life in your development of volume environment.

 

  • We can engineer our sockets best fitting to your existing hardware setup, replace existing competitor sockets or design customized sockets based on your personal socket features.

 

  • We provide one solution for engineering and volume production

 

  • We are focused to reduce your costs of test by highest reliability, easy maintenance, short delivery times and competitive price

With our our partner Win Way Technology (Taiwan) we can offer anything you need, no matter if it is a lower-end "standard" product, high-end RF speed or high power device, Kelvin type test applications, low volume manual test or multi-site ATE production test and even WLP / WCSP / WLCSP wafer level vertical probecards.


Win Way Technology (WWT) is the Number One test socket designer & manufacturer in Taiwan, close to many major back-end production / test centers and sub-contractors.

WWT is a Service oriented company that regards its customers as business partners. We maintain a high level of standards for ourselves by providing on-time service and solutions because our customers demand it. As a pioneer of Innovation in the ever changing electronics testing industry WWT holds numerous patents and continues to deliver creative and innovative testing solutions for its customers.

 

Please click HERE to find our more about Winway Technology.
 

Spring Probe Quality Test Sockets & Wafer-Level Probing Contactors

 

Standard Spring Pin

BGA – LGA – SO – TSOP I & II – QFP –

LCC – QFN/MLF/MLP – CSP – MCM – WLCSP

Including Kelvin options for all package types

  • Pitches < 0,2 mm

  • Kelvin / Force & Sense Pitch 0,4mm

  • High Current

  • Low spring pin force

  • >1000k insertions

Please click HERE to find out more about Win Way Spring Probe Test Sockets and Contactors.

     
Rigid Pin Quality Test Sockets & Wafer-Level Probing Contactors

 

 

 

"U Contact" rigid-type for high performance test

SOP – SSOP – TSSOP – QFP – QFN - PLCC – LCC …

Including Kelvin options for all package types

  • Pitches >= 0,3mm

  • Kelvin / Force & Sense option

  •  High frequency (12,8GhZ@-1dB)

  •  Current up to 2A

  •  Competitor compatible footprint possible

Please click HERE to find out more about the Win Way Rigid Pin Test Sockets and Contactors.

     
Conductive Rubber Contactors

 

With Pressure sensitive Conductive Rubber Sockets (PCR) type sockets the current is conducted by the pressure added on the PCR bump that leads to complete connection between the PCB/LB pads and solder balls. Typical applications with BGA - LGA - QFN

  • Pitches down to 0.3mm

  • High frequencies up to 14 GHz@-1dB

  • Min. contact resistance: ~ 20mΩ

  • Up to 3000 contacts

Please click HERE to find out more about the Win Way PCR-type Test Sockets and Contactors.

     
WLCSP - Wafer Level Chip Scale Package Test Application Solutions

 

 

WLCSP / CSP - For bumped Wafer and Alu pads

Pitches <0,2 possible

  • Planarity  ± 35µm

  • Bandwidth 6 Ghz

  • Current Rating  >1A (0,4mm Pitch)

  • Pitches < 0.2mm

  • Kelvin / Force & Sense (0.4mm pitch)

  • Lifetime >1000k

  • Universal Probe Head Option

Please click HERE to find out more about the Win Way WLCSP Test Sockets

 

 

Please contact aps for more information! 

 

Phone: 

0049 - (0)89-841 027-20

Fax:

0049 - (0)89-841 027-21

E-Mail

devicetest@aps-munich.com

   
   
   
   
     
     
     
   
     
     

 

   

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