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Test Sockets for IC Component Test - High-Performance Production Test Sockets and Contactors  

TEST SOCKET TECHNOLOGIES

 

Introduction

 

Technologies

 

Spring Probe Sockets

 

Rigid Pin Sockets

 

Conductive Rubber Sockets

 

Coaxial Socket

 

Package on Package (PoP)

 

Active Thermal Control (ATC)

 

Interposer Superbutton

 

Spring Pin Probe Head

 

WLCSP

 

Application Examples

 

Service & Support

 

Packages

 

RFQ Form

 

Contact

Email

Phone

 

 

Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices

High-Performance Multilayer Printed Circuit Boards for ATE Applications, Blank Boards for Probe Cards - Handler Interface Boards - Test Boards - Burn in Boards - Engineering and Demo Boards

aps Sales & Service GmbH - The European representative of the market leaders in Wafer Probing and IC Device Test

 

 

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To Win Way Homepage

 
 
Spring Probe Quality Test Sockets & Wafer-Level Probing Contactors

 

Standard Spring Pin

BGA – LGA – SO – TSOP I & II – QFP –

LCC – QFN/MLF/MLP – CSP – MCM – WLCSP

Including Kelvin options for all package types, Coaxial Sockets

  • Pitches < 0,2 mm

  • Kelvin / Force & Sense Pitch 0,4mm

  • High Current

  • Low spring pin force

  • Non (low) magentic characteristic

  • >1000k insertions

Please click HERE to find out more about Win Way Spring Probe Test Sockets and Contactors.

     
Rigid Pin Quality Test Sockets & Wafer-Level Probing Contactors

 

 

 

"U Contact" rigid-type for high performance test

SOP – SSOP – TSSOP – QFP – QFN - PLCC – LCC …

Including Kelvin options for all package types

  • Pitches >= 0,3mm

  • Kelvin / Force & Sense option

  •  High frequency (12,8GhZ@-1dB)

  •  Current up to 2A

  •  Competitor compatible footprint possible

Please click HERE to find out more about the Win Way Rigid Pin Test Sockets and Contactors.

     
Conductive Rubber Contactors

 

With Pressure sensitive Conductive Rubber Sockets (PCR) type sockets the current is conducted by the pressure added on the PCR bump that leads to complete connection between the PCB/LB pads and solder balls. Typical applications with BGA - LGA - QFN

  • Pitches down to 0.3mm

  • High frequencies up to 14 GHz@-1dB

  • Min. contact resistance: ~ 20mΩ

  • Up to 3000 contacts

Please click HERE to find out more about the Win Way PCR-type Test Sockets and Contactors.

     
Coaxial Test Socket

   
  • Pitch 0.5, 0.65, 0.8 1.0 and 1.27 mm

  • Up to 13 Ghz operating frequency

  • Impedance controlled for 50Ω, 75Ω or 90 Ω

  • minimize electrical noise

  • great EM wave shielding

  • high frequency performance

Please click HERE to find out more about the Win Way Coaxial Test Socket

 
PoP – Package on Package

 

 

For BGA and LGA applications

  • Standard Spring Pin

  • Kelvin options

  • Pitches < 0,4 mm

  • Kelvin / Force & Sense Pitch 0,4mm

  • High Current

Please click HERE to find out more about the Win Way PoP Sockets

 
ATC – Active Thermal Control

 

 

ATC – for monitoring the IC´s testing temperature during characterization

  • Max Temperature range (without loading): -60°C - +150°C

  • Temperature Accuracy: +-0,1°C (constant loading)

  • TEC cooling power (customized selection): 460W max

  • Termerature input: t-Type termocouple

  • Ramping time (without loading): ambient to +150°C: ~130sec,                    ambient to -60°C: ~400sec

  • Die Crack prevention

  • Over Temperature protection

  • Customized software GUI

Please click HERE to find out more about the Win Way Active Thermal Control

 
Interposer Superbutton

 

 

  • Pitches 0,75mm, 0,80mm 1,00mm

  • Min. Contact force: 10g

  • Max Contact force: 120g

  • Bandwidth up to 30Ghz

  • Contact resistance: <10mΩ

  • Travel: 0.1mm … 0.2mm

Please click HERE to find out more about the Win Way Interposer Superbutton

 
Spring Pin Probe Card

 

 

  • Pitches 150µm possible

  • Planarity  ± 35µm

  • Bandwidth 6.1 Ghz (@-1dB)

  • Current Rating  >1A (0,4mm Pitch)

  • Lifetime >1000k

  • Easy in Operation

  • Easy to Maintain

  • Capable of Singulated Die Test

  • Long contact travel (OD up to 200um)

Please click HERE to find out more about the Win Way Spring Pin Probecard

     
WLCSP - Wafer Level Chip Scale Package Test Application Solutions

 

 

WLCSP / CSP - For bumped Wafer and Alu pads

  • Pitches <0,2 possible

  • Planarity  ± 35µm

  • Bandwidth 6 Ghz

  • Current Rating  >1A (0,4mm Pitch)

  • Pitches < 0.2mm

  • Kelvin / Force & Sense (0.4mm pitch)

  • Lifetime >1000k

  • Universal Probe Head Option

Please click HERE to find out more about the Win Way WLCSP Test Sockets

     

 

Please contact aps for more information! 

 

Phone: 

0049 - (0)89-841 027-20

Fax:

0049 - (0)89-841 027-11

E-Mail

devicetest@aps-munich.com

   
   
   
   
     
     
     
     
     
     
     
     
     

 

   

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