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Probe Quality Test Sockets & Wafer-Level Probing Contactors |
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Standard
Spring Pin
BGA – LGA – SO
– TSOP I & II – QFP –
LCC –
QFN/MLF/MLP – CSP – MCM – WLCSP
Including
Kelvin options for all package types, Coaxial Sockets
Please
click HERE
to find out more about Win Way Spring Probe Test Sockets and Contactors. |
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Rigid Pin Quality Test Sockets & Wafer-Level Probing Contactors |
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"U Contact"
rigid-type for high performance test
SOP – SSOP
– TSSOP – QFP – QFN - PLCC – LCC …
Including
Kelvin options for all package types
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Pitches
>= 0,3mm
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Kelvin /
Force & Sense option
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High
frequency (12,8GhZ@-1dB)
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Current
up to 2A
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Competitor
compatible footprint possible
Please
click HERE to find out more
about the Win Way Rigid Pin Test Sockets and Contactors. |
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Conductive Rubber
Contactors |
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With
Pressure
sensitive Conductive
Rubber Sockets (PCR) type sockets the current is conducted by the pressure added
on the PCR bump that leads to complete connection between the PCB/LB pads
and solder balls. Typical applications with BGA - LGA - QFN
Please
click HERE to find out more
about the Win Way PCR-type Test Sockets and Contactors. |
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Coaxial Test Socket |
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Pitch 0.5, 0.65, 0.8 1.0 and 1.27 mm
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Up to 13 Ghz operating frequency
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Impedance controlled for 50Ω,
75Ω
or 90
Ω
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minimize electrical noise
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great EM wave shielding
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high frequency performance
Please
click
HERE to find out more about the
Win Way Coaxial Test Socket |
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PoP – Package on
Package |
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For BGA and LGA applications
Please
click
HERE to find out more about the
Win Way PoP Sockets |
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ATC – Active Thermal Control |
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ATC – for monitoring the IC´s testing temperature during
characterization
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Max Temperature range (without
loading): -60°C - +150°C
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Temperature Accuracy:
+-0,1°C (constant loading)
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TEC cooling power (customized
selection): 460W max
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Termerature input: t-Type
termocouple
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Ramping time (without
loading): ambient to +150°C: ~130sec,
ambient to -60°C: ~400sec
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Die Crack prevention
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Over Temperature
protection
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Customized software GUI
Please
click
HERE to find out more about the
Win Way Active Thermal Control |
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Interposer Superbutton |
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Pitches 0,75mm, 0,80mm 1,00mm
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Min. Contact force: 10g
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Max Contact force: 120g
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Bandwidth up to 30Ghz
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Contact resistance: <10mΩ
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Travel: 0.1mm … 0.2mm
Please
click
HERE to find out more about the
Win Way Interposer Superbutton |
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Spring Pin Probe Card |
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Pitches 150µm possible
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Planarity
±
35µm
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Bandwidth 6.1 Ghz (@-1dB)
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Current Rating >1A (0,4mm Pitch)
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Lifetime >1000k
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Easy in Operation
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Easy to Maintain
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Capable of Singulated Die Test
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Long contact travel (OD up to 200um)
Please
click
HERE to find out more about the
Win Way Spring Pin Probecard |
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WLCSP - Wafer Level Chip Scale Package Test
Application Solutions |
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WLCSP / CSP -
For bumped Wafer and Alu pads
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Pitches <0,2
possible
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Planarity
±
35µm
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Bandwidth
6 Ghz
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Current
Rating >1A (0,4mm Pitch)
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Pitches <
0.2mm
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Kelvin /
Force & Sense (0.4mm pitch)
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Lifetime >1000k
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Universal Probe Head
Option
Please
click HERE to find out more
about the Win Way WLCSP Test Sockets |
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