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Introduction
Application Examples
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Spring
Probe & other Application Examples for Engineering, System Level Test, Production (ATE) Test and Wafer Probing Below you see a sample selection of Spring Probe and other test contactors (for various packages and test handlers) that we have done and which helped our customers to efficiently test their devices in various application fields and hardware environments. |
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Spring Pin
Package: BGA1117 40x40 mm
Handler:
Synax 1701 |
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Spring Pin
Package: QFN48 7x7 mm Handler: manual test only |
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Spring Pin
4 modules optical openings extra LED support (red / green) customized Stiffener
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Universal WLCSP Probe head with Spring Pins
0,4 mm Pitch 16 DUT DUT Matrix 2x3 DUT arrangement 2x8 144 Pins |
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Rigid Pin - "U-Contact"
Package outline: 14mm x 14mm Pitch: 0,5 mm Pin Count: 100
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PCR (Pressure Conductive Rubber)
FCBGA (Flip Chip BGA) Package size: 29x29 Ball matrix: M35x35 Pitch: 0,8mm
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Please contact aps for more information!
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PROBECARDS
- MULTILAYER
PCB - TEST
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- HOME Web Site Design: www.hermann-fuchs.de |
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