Home - Test Sockets - Coaxial Sockets
Test Sockets for IC Component Test - High-Performance Production Test Sockets and Contactors    
  Introduction   Active Thermal Control (ATC)
 

 

Technologies

 

Application Examples

 

Service & Support

 

Packages

 

Active Thermal Control (ATC)

 

RFQ Form

 

Contact

Email

Phone

 
   
 

ATC – for monitoring the IC´s testing temperature during characterization

  • Max Temperature range (without loading): -60°C - +150°C

  • Temperature Accuracy: +-0,1°C (constant loading)

  • TEC cooling power (customized selection): 460W max

  • Termerature input: t-Type termocouple

  • Ramping time (without loading): ambient to +150°C: ~130sec, ambient to -60°C: ~400sec

  • Die Crack prevention

  • Over Temperature protection

  • Customized software GUI

 

 
 
   
Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices
High-Performance Multilayer Printed Circuit Boards for ATE Applications, Blank Boards for Probe Cards - Handler Interface Boards - Test Boards - Burn in Boards - Engineering and Demo Boards
aps Sales & Service GmbH - The European representative of the market leaders in Wafer Probing and IC Device Test
 
 
 
 
Site Map
  Home  

Semiautomatic and automatic design available

  Impressum  

 
       
       
       
       
       
       
  To Win Way Homepage    
     

 

Please contact aps for more information! 

 

Phone: 

0049 - (0)89-841 027-20

Fax:

0049 - (0)89-841 027-11

E-Mail

devicetest@aps-munich.com

   
   
     
   

PROBECARDS - MULTILAYER PCB - TEST SOCKETS - EQUIPMENTSERVICE - COMPANY - HOME
Site Map - Impressum - Webmaster- www.aps-munich.com  

Web Site Design: www.hermann-fuchs.de