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The Spring Probe Pin
(also known as "Pogo-Pin") is probably the most utilized and most
flexible test contactor pin today. It is available in various
structures, diameters and lengths to cover almost any kind of device or
application.
Spring Probes offer
straight vertical contacts with 1:1 DUT pattern footprints, which makes
them perfect for array devices like BGA, LGA and PGA (e.g. ACTEL, ALTERA,
LATTICE, QUICKLOGIC and XILINX FPGA's) - but due to their
versatility they are perfect for QFN/MLF/MLP, QFP,
SOP, LCC, CSP and even FPC's or MCM modules, too.
Pitches can be as small as 0.3mm
(and even smaller),
pin counts up to more than 2000.
The sockets are precisely
machined in durable engineering plastics, and feature patented design
structures for optimal alignment and best contact.
Our Spring Probe test
sockets are designed for a large variety of ICs including high test
frequencies of 20+ GHz for computing & graphics ICs, Bluetooth, RF
modules, amplifiers, microcontrollers, power management devices, CMOS
image sensors etc.
They are ideal for
production Final Test, low volume hand-test and engineering purposes
like SLT (System Level Test), and also for highly cost-effective WLP /
WCSP / WLCSP vertical wafer probing applications.
The sockets are available
for full compatibility to existing contactors with 1:1 DUT patterns
(e.g. Antares, Synergetix, ECT), and feature various lid types without
and with passive or active cooling, or even with integrated air-blow
channels.
Of course, our sockets
feature sufficient space for SMD components close to the DUT.
Win Way dedicated Spring
Probes come in an infinite variety and are available with self inductance down to 0.2nH, and to a
bandwidth up to 22 GHz at -1dB.
Other features are long
cycle lifetime, high reliability and easy maintenance for cost-effective
test of your devices.
Of course, our
Spring Probes are optimized for lead-free
pad & lead materials like matte Sn and SnAgCu! |