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 "U-Contact" rigid type for high performance test

 SOP – SSOP – TSSOP – QFP – QFN - PLCC – LCC …

  • Narrow pitch >= 0.3mm

  • High frequency Characteristics (12,8GhZ@-1dB)

  • Current up to 2A

  • Competitor compatible footprint possible

  • Long life time: 1000k+

 
   
Capable for Kelvin contact test (Force/Sense)
   
   
 
Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices
High-Performance Multilayer Printed Circuit Boards for ATE Applications, Blank Boards for Probe Cards - Handler Interface Boards - Test Boards - Burn in Boards - Engineering and Demo Boards
aps Sales & Service GmbH - The European representative of the market leaders in Wafer Probing and IC Device Test
 
 
 
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Please contact aps for more information! 

 

Phone: 

0049 - (0)89-841 027-20

Fax:

0049 - (0)89-841 027-11

E-Mail

devicetest@aps-munich.com
   
   
     
   

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