Conventional Cantilever

•  Up to 72 DUT parallel
•  Fine Pitch down to 25µm
•  High Current up to 2A/pin
•  Kelvin
•  Temperature range for one probe-card -40°C ~ 160°C
•  Minute Current from 1pA to 100 fA with personalized PCBs
•  Customized Steel-Tops “Hanging Style” or combined with Stiffener;  both solutions decoupled of Main-PCB
•  Cold Sealing and Needle Ring Lid for Cold Temperature
•  Manufacturing Jigs for all common Testers
•  Available Needle Material for different pad material:
•  Customized PCBs or a great amount of universal PCBs for all common  Tester Systems.
•  European Quality Repair and Refreshment Center

Please get in contact with us for further information or fill out our Request Sheet and we will advice you asap.

Please download and fill out the document RFQ/Feasibilty Study Form

and send to: wafertest@aps-munich.com

Document for Download:RFQ/Feasibilty Study Form