Home - Probe Card - Applications & Products - WLCSP- Spring Pin Probe Card
Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices   PROBE CARD Applications & Products - WLCSP - eWLB / WLBI
 

Introduction

  

Spring Pin Probe Card
Application & Products  

 

  • Pitches 150µm possible

  • Planarity  ± 35µm

  • Bandwidth 6.1 Ghz (@-1dB)

  • Current Rating  >1A (0,4mm Pitch)

  • Lifetime >1000k

  • Easy in Operation

  • Easy to Maintain

  • Capable of Singulated Die Test

  • Long contact travel (OD up to 200um)

Manual Option
  Cantilever Type  

  Vertical Type  
  WLCSP  
    Socket Type Probe Head  
    Spring Pin Probe Card  
     
   
Support & Service    
   
Accessories    
     
Contact    
Email    
Phone      
   

Direct Dock Probe Card Structure
High-Performance Multilayer Printed Circuit Boards for ATE Applications, Blank Boards for Probe Cards - Handler Interface Boards - Test Boards - Burn in Boards - Engineering and Demo Boards  

Test Sockets for IC Component Test - High-Performance Production Test Sockets and Contactors  
 
aps Sales & Service GmbH - The European representative of the market leaders in Wafer Probing and IC Device Test  
   
   
Site Map  
Home    
Impressum  
    Please contact aps for more information! 

 

  
     
Phone:  0049 - (0)89-841 027-10
Fax: 0049 - (0)89-841 027-11
E-Mail wafertest@aps-munich.com
     

 
   

PROBECARDS - MULTILAYER PCB - TEST SOCKETS - EQUIPMENT - SERVICE - COMPANY - HOME
Site Map - Impressum - Webmaster- www.aps-munich.com  

Web Site Design: www.hermann-fuchs.de