Vertical Probecard Technology

• Modular Design Concept
• Multi DUT Peripheral / Full Array Test for Logic IC
• Test Temperature range for one probe-card -40°C ~ 150°C
• Flat and Round Needle Tips available
• High Speed Test with HF-Probe Head
• New Space Transformer Interface Solutions with HW/MLO/MLC/INT
• High Frequency for Hand-Wired Vertical PC (Hand-Wired Space-Transformer: 900MHz @-3dB)
• Flexible Assembly @ High performance
• Reduced cross-talk

Fine-Pitch PC-Assembly:

High Parallel
Hand-Wired and Multi-Layer Space-Transformer and direct-Attach PC-assembly (x8, x16, x32, x64, x128, x256, x512)

Non-Floating Probe-Head assembly
For permanent electrical and mechanical docking of Probehead to Space-Transformer

• lower and stable electrical resistance
• no damage to landing-pad

CHIP CARD
240 DUT Parallel Test
1200 P7 Pins
ML Space-Transformer
Test-Temperature: 25 - 125°C
Customized PCB
Full Application-Area Steeltop

LOGIC
16 DUT Parallel Test
112 P7 Pins
Non-Floating ProbeHead Design
HandWired Space-Transformer
Test-Temperature: -40 - 85°C
Universal Cantilever PCB

Kelvin Probe Mark