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Probe Cards for Wafer Probing of Memory, Logic, Chip Card and LCD Devices   PROBE CARD Applications & Products - WLCSP - eWLB / WLBI
 

Introduction

  

WLCSP - Wafer Level Chip Scale Package
Application & Products   Suitable for Logic, Chip Card and other applications
  Cantilever Type    
  Vertical Type   Spring Probe Socket Probe Head  
  WLCSP   Highlights
  • One Solution both for socket test and wafer test!
  • Different Spring-Pins to meet Bump-Pitches and Probe-Heights
  • Multi-DUT probing
  • Various Tip-Shapes
  • Suitable also for Al and Cu Pads

Basic Specification List

WLCSP-data

For available Configurations and feasibility study with detailed FEM-Analysis please get in contact with us and fill out the document RFQ/Feasibilty Study Form and send to: wafertest@aps-munich.com

Document for Download: RFQ/Feasibilty Study Form

 

 

Probe-Card for WLSCP Test with Spring Pin Socket Probe Head
    Socket Type Probe Head  
       
     
   
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